Advanced Techniques for Material Characterization Using Precession-Assisted 4D STEM

On-Demand Webinar: Advanced Materials Characterization with Precession-Assisted 4D STEM

This webinar will provide several examples of analytical microscopy performed on the TESCAN TENSOR, showing how you can leverage fast electron beam precession, a fully integrated direct electron detector, large solid-angle EDX detectors, and automated data processing to efficiently characterise complex materials.